Heavy metal content tester

Total reflection X-ray fluorescence works (TXRF)

Principle of X-ray fluorescence spectrometry (XRF): the atomic level by the original X-ray excitation, the issue of secondary X-ray fluorescence. Therefore, XRF analysis can:

According to the fluorescence wavelength and energy, to determine the element;

The concentration of each element can be calculated based on the intensity of fluorescence.

X-rays by a Mo target or W target produced in Ni / C multilayer film reflective artificial and monochromatic. Flat beam with a very small angle (0.3 - 0.6 °) grazing the sample holder containing the sample, and total reflection occurs. Characteristic fluorescence generated by the sample is energy dispersive detector (XFlash® detector) to detect, by coupling the strength of a multichannel analyzer measurement.

The biggest difference conventional XRF, total reflection fluorescence (TXRF) is the use of monochromatic light and the total reflection optical member. In the total reflection beam irradiated samples, reducing the absorption, and the sample and light scattering substrate materials. The result is greatly reduced background noise, and therefore there is a much higher sensitivity and significantly reducing the matrix effect.

Total internal reflection fluorescence (TXRF) The main advantage is that, compared to other atomic spectroscopy methods such as AAS or ICP-OES, no memory effect.

Total reflection fluorescence analysis, the sample can be prepared in a total reflection X-ray sample holder. Therefore, the sample holder diameter 30mm, typically of acrylic material or quartz glass.

Liquid sample directly onto the sample holder, typically using a micropipette transfer pipette a few microliters (μl) of test solution to the sample holder. Then evaporated and dried in an oven or a desiccator.

Solid sample, different sample preparation methods. Powder samples (suspended matter, soil, minerals, metals, pigments, biological samples, etc.) can be placed directly on the sample holder with the sample measured directly. A typical approach is to use a spoon or airlaid transfer several micrograms (μg) of the sample to the sample holder.

Single small sample (particles, slivers, etc.) can also be prepared directly by methods analogous sample.

In addition, the powder sample may be a volatile solvent such as acetone or methanol to prepare a suspension, suspension was pipetted into a sample holder, microwave digestion methods may also be used.

Main features:

Main technical characteristics

Available for solids, powders, liquids, suspensions, filter material, airborne particulates, such as film samples for qualitative and quantitative analysis of a range of elements 13Al-92U, content range ppb to 100%, the detection limit to 2pg.

Require less sample, less than 10 micrograms of suspended solids in liquids and 1-50 microliters of sample powder samples.

Unique portable total reflection fluorescence analyzer, equipment compact, integrated design, without any auxiliary equipment and gas, liquid nitrogen, etc., can get a site analysis.

1 and 25 automatic injector two designs were applied to a fully automatic analysis of small samples and large numbers of samples per day.

XFlash®SDD fourth generation silicon drift detector, using a Peltier cooling technology, no nitrogen, no consumption. Resolution better than 160eV at MnKa 100Kcps.

Due to the total reflection no background fluorescence intensity is directly proportional to the element content. Factories have been calibrated standard curve, users do not need standard quantitative analysis can be carried out.

Applications: water, wastewater, soil pollution elements; food, medicine, forensic, environmental protection, ceramics, cement, building materials, geology; blood, urine, tissue toxic elements.